High Speed Production Test Solutions
Applications include Semiconductor Process Control Monitoring (PCM), TEG Test, and Die Sort
. Parallel Test capability maximizes test throughput
. Measure from kV to fA in a single probe touchdown to further boost productivity
. ISO-17025 System-level calibration
. Smooth migration from legacy test systems, including probe card re-use
. Low Cost-of-Ownership (COO)
Fully Customizable Test Solutions
Applications include R&D, Reliability, Off-line Analysis, and Functional Test of Semiconductors, Components / Subassemblies, and Displays
. Fully custom, system solutions including safety / EMO, power distribution, and software
. Scalable, instrumentation-based hardware architecture and flexible, user-defined software solutions
. High density SMU-per-pin or matrix configurations available
. Measure from kV to fA, including high-speed pulsing, capacitance, and more using Keithley’s most popular products, as well as other brands
. Built-in analysis tools such as WLR available
