NewsroomTektronix Introduces S530 Parametric Test System with KTE V7.1 Software to Speed Semiconductor Chip Production
BEAVERTON, Ore., Sept. 16, 2021 /PRNewswire/ — Tektronix, Inc., a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series Parametric Test System to help accelerate semiconductor chip manufacturing just when the world market needs it most. New options made available for the first [...]